"False negative -- that one is going to kill you": Understanding Industry Perspectives of Static Analysis based Security Testing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ami, Amit Seal, Moran, Kevin, Poshyvanyk, Denys, Nadkarni, Adwait
Format:	Preprint
Published:	2023
Subjects:	Cryptography and Security Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2307.16325