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Effect of Grain Coalescence on Dislocation and Stress Evolution of GaN Films Grown on Nanoscale Patterned Sapphire Substrates

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Pan, Zuojian, Chen, Zhizhong, Chen, Yiyong, Zhang, Haodong, Yang, Han, Nie, Jingxin, Deng, Chuhan, Dong, Boyan, Wang, Daqi, Li, Yuchen, Chen, Weihua, Jiao, Fei, Kang, Xiangning, Jia, Chuanyu, Liang, Zhiwen, Wang, Qi, Zhang, Guoyi, Shen, Bo
Format:	Preprint
Publié:	2023
Sujets:	Materials Science
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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