Kang, T. Y., Lee, H., & Suh, S. (2023). An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-parameter Patterns.
Chicago Style (17th ed.) CitationKang, Tae Yeob, Haebom Lee, and Sungho Suh. An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-parameter Patterns. 2023.
MLA (9th ed.) CitationKang, Tae Yeob, et al. An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-parameter Patterns. 2023.
Warning: These citations may not always be 100% accurate.