Supercell formation in epitaxial rare-earth ditelluride thin films

Fuente: arXiv
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Main Authors: Llanos, Adrian, Salmani-Rezaie, Salva, Kim, Jinwoong, Kioussis, Nicholas, Muller, David A., Falson, Joseph
Format: Preprint
Published: 2023
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author Llanos, Adrian
Salmani-Rezaie, Salva
Kim, Jinwoong
Kioussis, Nicholas
Muller, David A.
Falson, Joseph
author_facet Llanos, Adrian
Salmani-Rezaie, Salva
Kim, Jinwoong
Kioussis, Nicholas
Muller, David A.
Falson, Joseph
contents Square net tellurides host an array of electronic ground states and commonly exhibit charge-density-wave ordering. Here we report the epitaxy of DyTe$_{2-δ}$ on atomically flat MgO (001) using molecular beam epitaxy. The films are single phase and highly oriented as evidenced by transmission electron microscopy and X-ray diffraction measurements. Epitaxial strain is evident in films and is relieved as the thickness increases up to a value of approximately 20 unit cells. Diffraction features associated with a supercell in the films are resolved which is coupled with Te-deficiency. First principles calculations attribute the formation of this defect lattice to nesting conditions in the Fermi surface, which produce a periodic occupancy of the conducting Te square-net, and opens a band gap at the chemical potential. This work establishes the groundwork for exploring the role of strain in tuning electronic and structural phases of epitaxial square-net tellurides and related compounds.
format Preprint
id arxiv_https___arxiv_org_abs_2308_14159
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Supercell formation in epitaxial rare-earth ditelluride thin films
Llanos, Adrian
Salmani-Rezaie, Salva
Kim, Jinwoong
Kioussis, Nicholas
Muller, David A.
Falson, Joseph
Materials Science
Square net tellurides host an array of electronic ground states and commonly exhibit charge-density-wave ordering. Here we report the epitaxy of DyTe$_{2-δ}$ on atomically flat MgO (001) using molecular beam epitaxy. The films are single phase and highly oriented as evidenced by transmission electron microscopy and X-ray diffraction measurements. Epitaxial strain is evident in films and is relieved as the thickness increases up to a value of approximately 20 unit cells. Diffraction features associated with a supercell in the films are resolved which is coupled with Te-deficiency. First principles calculations attribute the formation of this defect lattice to nesting conditions in the Fermi surface, which produce a periodic occupancy of the conducting Te square-net, and opens a band gap at the chemical potential. This work establishes the groundwork for exploring the role of strain in tuning electronic and structural phases of epitaxial square-net tellurides and related compounds.
title Supercell formation in epitaxial rare-earth ditelluride thin films
topic Materials Science
url https://arxiv.org/abs/2308.14159