Fundamental charge noise in electro-optic photonic integrated circuits
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arXiv
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| Main Authors: | , , , , , |
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| Format: | Preprint |
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2023
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| _version_ | 1866916618472259584 |
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| author | Zhang, Junyin Li, Zihan Riemensberger, Johann Lihachev, Grigory Huang, Guanhao Kippenberg, Tobias J. |
| author_facet | Zhang, Junyin Li, Zihan Riemensberger, Johann Lihachev, Grigory Huang, Guanhao Kippenberg, Tobias J. |
| contents | Understanding thermodynamical measurement noise is of central importance for electrical and optical precision measurements from mass-fabricated semiconductor sensors, where the Brownian motion of charge carriers poses limits, to optical reference cavities for atomic clocks or gravitational wave detection, which are limited by thermorefractive and thermoelastic noise due to the transduction of temperature fluctuations to the refractive index and length fluctuations. Here, we discover that unexpectedly charge carrier density fluctuations give rise to a novel noise process in recently emerged electro-optic photonic integrated circuits. We show that Lithium Niobate and Lithium Tantalate photonic integrated microresonators exhibit an unexpected Flicker type (i.e. $1/f^{1.2}$) scaling in their noise properties, significantly deviating from the well-established thermorefractive noise theory. We show that this noise is consistent with thermodynamical charge noise, which leads to electrical field fluctuations that are transduced via the strong Pockels effects of electro-optic materials. Our results establish electrical Johnson-Nyquist noise as the fundamental limitation for Pockels integrated photonics, crucial for determining performance limits for both classical and quantum devices, ranging from ultra-fast tunable and low-noise lasers, Pockels soliton microcombs, to quantum transduction, squeezed light or entangled photon-pair generation. Equally, this observation offers optical methods to probe mesoscopic charge fluctuations with exceptional precision. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2308_15404 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Fundamental charge noise in electro-optic photonic integrated circuits Zhang, Junyin Li, Zihan Riemensberger, Johann Lihachev, Grigory Huang, Guanhao Kippenberg, Tobias J. Optics Applied Physics Quantum Physics Understanding thermodynamical measurement noise is of central importance for electrical and optical precision measurements from mass-fabricated semiconductor sensors, where the Brownian motion of charge carriers poses limits, to optical reference cavities for atomic clocks or gravitational wave detection, which are limited by thermorefractive and thermoelastic noise due to the transduction of temperature fluctuations to the refractive index and length fluctuations. Here, we discover that unexpectedly charge carrier density fluctuations give rise to a novel noise process in recently emerged electro-optic photonic integrated circuits. We show that Lithium Niobate and Lithium Tantalate photonic integrated microresonators exhibit an unexpected Flicker type (i.e. $1/f^{1.2}$) scaling in their noise properties, significantly deviating from the well-established thermorefractive noise theory. We show that this noise is consistent with thermodynamical charge noise, which leads to electrical field fluctuations that are transduced via the strong Pockels effects of electro-optic materials. Our results establish electrical Johnson-Nyquist noise as the fundamental limitation for Pockels integrated photonics, crucial for determining performance limits for both classical and quantum devices, ranging from ultra-fast tunable and low-noise lasers, Pockels soliton microcombs, to quantum transduction, squeezed light or entangled photon-pair generation. Equally, this observation offers optical methods to probe mesoscopic charge fluctuations with exceptional precision. |
| title | Fundamental charge noise in electro-optic photonic integrated circuits |
| topic | Optics Applied Physics Quantum Physics |
| url | https://arxiv.org/abs/2308.15404 |