Three-dimensional imaging of buried heterointerfaces
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arXiv
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| Main Authors: | , , , , , , , , |
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| Format: | Preprint |
| Published: |
2023
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| _version_ | 1866913355268096000 |
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| author | O'Leary, Colum M. Sha, Haozhi Zhang, Jianhua Su, Cong Kahn, Salman Jiang, Huaidong Zettl, Alex Ciston, Jim Miao, Jianwei |
| author_facet | O'Leary, Colum M. Sha, Haozhi Zhang, Jianhua Su, Cong Kahn, Salman Jiang, Huaidong Zettl, Alex Ciston, Jim Miao, Jianwei |
| contents | We report three-dimensional (3D) structure determination of a twisted hexagonal boron nitride (h-BN) heterointerface from a single-view data set using multislice ptychography. We identify the buried heterointerface between two twisted h-BN flakes with a lateral resolution of 0.57 Å and a depth resolution of 2.5 nm. The latter is a significant improvement (~2.7 times) over the aperture-limited depth resolution of incoherent imaging modes such as annular-dark-field scanning transmission electron microscopy. This is attributed to the diffraction signal extending beyond the aperture edge with the depth resolution set by the curvature of the Ewald sphere. Future advances to this approach could improve the depth resolution to the sub-nanometer level and enable the identification of individual dopants, defects and color centers in twisted heterointerfaces and other materials. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2308_15471 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Three-dimensional imaging of buried heterointerfaces O'Leary, Colum M. Sha, Haozhi Zhang, Jianhua Su, Cong Kahn, Salman Jiang, Huaidong Zettl, Alex Ciston, Jim Miao, Jianwei Materials Science Mesoscale and Nanoscale Physics Applied Physics We report three-dimensional (3D) structure determination of a twisted hexagonal boron nitride (h-BN) heterointerface from a single-view data set using multislice ptychography. We identify the buried heterointerface between two twisted h-BN flakes with a lateral resolution of 0.57 Å and a depth resolution of 2.5 nm. The latter is a significant improvement (~2.7 times) over the aperture-limited depth resolution of incoherent imaging modes such as annular-dark-field scanning transmission electron microscopy. This is attributed to the diffraction signal extending beyond the aperture edge with the depth resolution set by the curvature of the Ewald sphere. Future advances to this approach could improve the depth resolution to the sub-nanometer level and enable the identification of individual dopants, defects and color centers in twisted heterointerfaces and other materials. |
| title | Three-dimensional imaging of buried heterointerfaces |
| topic | Materials Science Mesoscale and Nanoscale Physics Applied Physics |
| url | https://arxiv.org/abs/2308.15471 |