Integral Probability Metrics Meet Neural Networks: The Radon-Kolmogorov-Smirnov Test

Fuente: arXiv

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Bibliographic Details
Main Authors:	Paik, Seunghoon, Celentano, Michael, Green, Alden, Tibshirani, Ryan J.
Format:	Preprint
Published:	2023
Subjects:	Machine Learning Methodology
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2309.02422