Boltzmann sampling with quantum annealers via fast Stein correction

Fuente: arXiv
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Main Authors: Shibukawa, Ryosuke, Tamura, Ryo, Tsuda, Koji
Format: Preprint
Published: 2023
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_version_ 1866910176609566720
author Shibukawa, Ryosuke
Tamura, Ryo
Tsuda, Koji
author_facet Shibukawa, Ryosuke
Tamura, Ryo
Tsuda, Koji
contents Despite the attempts to apply a quantum annealer to Boltzmann sampling, it is still impossible to perform accurate sampling at arbitrary temperatures. Conventional distribution correction methods such as importance sampling and resampling cannot be applied, because the analytical expression of sampling distribution is unknown for a quantum annealer. Stein correction (Liu and Lee, 2017) can correct the samples by weighting without the knowledge of the sampling distribution, but the naive implementation requires the solution of a large-scale quadratic program, hampering usage in practical problems. In this letter, a fast and approximate method based on random feature map and exponentiated gradient updates is developed to compute the sample weights, and used to correct the samples generated by D-Wave quantum annealers. In benchmarking problems, it is observed that the residual error of thermal average calculations is reduced significantly. If combined with our method, quantum annealers may emerge as a viable alternative to long-established Markov chain Monte Carlo methods.
format Preprint
id arxiv_https___arxiv_org_abs_2309_04120
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Boltzmann sampling with quantum annealers via fast Stein correction
Shibukawa, Ryosuke
Tamura, Ryo
Tsuda, Koji
Statistical Mechanics
Quantum Physics
Despite the attempts to apply a quantum annealer to Boltzmann sampling, it is still impossible to perform accurate sampling at arbitrary temperatures. Conventional distribution correction methods such as importance sampling and resampling cannot be applied, because the analytical expression of sampling distribution is unknown for a quantum annealer. Stein correction (Liu and Lee, 2017) can correct the samples by weighting without the knowledge of the sampling distribution, but the naive implementation requires the solution of a large-scale quadratic program, hampering usage in practical problems. In this letter, a fast and approximate method based on random feature map and exponentiated gradient updates is developed to compute the sample weights, and used to correct the samples generated by D-Wave quantum annealers. In benchmarking problems, it is observed that the residual error of thermal average calculations is reduced significantly. If combined with our method, quantum annealers may emerge as a viable alternative to long-established Markov chain Monte Carlo methods.
title Boltzmann sampling with quantum annealers via fast Stein correction
topic Statistical Mechanics
Quantum Physics
url https://arxiv.org/abs/2309.04120