Scanning gate microscopy of nonretracing electron-hole trajectories in a normal-superconductor junction
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arXiv
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| Autores principales: | , , |
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| Formato: | Preprint |
| Publicado: |
2023
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| _version_ | 1866909134430928896 |
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| author | Maji, S. Sowa, K. Nowak, M. P. |
| author_facet | Maji, S. Sowa, K. Nowak, M. P. |
| contents | We theoretically study scanning gate microscopy (SGM) of electron and hole trajectories in a quantum point contact (QPC) embedded in a normal-superconductor (NS) junction. At zero voltage bias, the electrons and holes transported through the QPC form angular lobes and are subject to self-interference, which marks the SGM conductance maps with interference fringes analogously as in normal systems. We predict that for an NS junction at non-zero bias a beating pattern is to occur in the conductance probed with the use of the SGM technique owing to a mismatch of the Fermi wavevectors of electrons and holes. Moreover, the SGM technique exposes a pronounced disturbance in the angular conductance pattern, as the retroreflected hole does not retrace the electron path due to wavevector difference. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2310_03523 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Scanning gate microscopy of nonretracing electron-hole trajectories in a normal-superconductor junction Maji, S. Sowa, K. Nowak, M. P. Mesoscale and Nanoscale Physics We theoretically study scanning gate microscopy (SGM) of electron and hole trajectories in a quantum point contact (QPC) embedded in a normal-superconductor (NS) junction. At zero voltage bias, the electrons and holes transported through the QPC form angular lobes and are subject to self-interference, which marks the SGM conductance maps with interference fringes analogously as in normal systems. We predict that for an NS junction at non-zero bias a beating pattern is to occur in the conductance probed with the use of the SGM technique owing to a mismatch of the Fermi wavevectors of electrons and holes. Moreover, the SGM technique exposes a pronounced disturbance in the angular conductance pattern, as the retroreflected hole does not retrace the electron path due to wavevector difference. |
| title | Scanning gate microscopy of nonretracing electron-hole trajectories in a normal-superconductor junction |
| topic | Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2310.03523 |