Tightness of exponential metrics for log-correlated Gaussian fields in arbitrary dimension

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ding, Jian, Gwynne, Ewain, Zhuang, Zijie
Format:	Preprint
Published:	2023
Subjects:	Probability Mathematical Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2310.03996