Probing Fermi surface parity with spin resolved transverse magnetic focussing

Fuente: arXiv
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Autores principales: Rendell, M. J., Liles, S. D., Bladwell, S., Srinivasan, A., Klochan, O., Farrer, I., Ritchie, D. A., Sushkov, O. P., Hamilton, A. R.
Formato: Preprint
Publicado: 2023
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author Rendell, M. J.
Liles, S. D.
Bladwell, S.
Srinivasan, A.
Klochan, O.
Farrer, I.
Ritchie, D. A.
Sushkov, O. P.
Hamilton, A. R.
author_facet Rendell, M. J.
Liles, S. D.
Bladwell, S.
Srinivasan, A.
Klochan, O.
Farrer, I.
Ritchie, D. A.
Sushkov, O. P.
Hamilton, A. R.
contents Measurements of the Fermi surface are a fundamental technique for determining the electrical and magnetic properties of solids. In 2D systems, the area and diameter of the Fermi surface is typically measured using Shubnikov-de Haas oscillations and commensurability oscillations respectively. However, these techniques are unable to detect changes in the parity of the Fermi surface (i.e. when +k $\neq$ -k). Here, we show that transverse magnetic focussing can be used to detect such changes, because focussing only measures a well defined section of the Fermi surface and does not average over +k and -k. Furthermore, our results show that focussing is an order of magnitude more sensitive to changes in the Fermi surface than other 2D techniques, and could be used to investigate similar Fermi surface changes in other 2D systems.
format Preprint
id arxiv_https___arxiv_org_abs_2310_04005
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Probing Fermi surface parity with spin resolved transverse magnetic focussing
Rendell, M. J.
Liles, S. D.
Bladwell, S.
Srinivasan, A.
Klochan, O.
Farrer, I.
Ritchie, D. A.
Sushkov, O. P.
Hamilton, A. R.
Mesoscale and Nanoscale Physics
Measurements of the Fermi surface are a fundamental technique for determining the electrical and magnetic properties of solids. In 2D systems, the area and diameter of the Fermi surface is typically measured using Shubnikov-de Haas oscillations and commensurability oscillations respectively. However, these techniques are unable to detect changes in the parity of the Fermi surface (i.e. when +k $\neq$ -k). Here, we show that transverse magnetic focussing can be used to detect such changes, because focussing only measures a well defined section of the Fermi surface and does not average over +k and -k. Furthermore, our results show that focussing is an order of magnitude more sensitive to changes in the Fermi surface than other 2D techniques, and could be used to investigate similar Fermi surface changes in other 2D systems.
title Probing Fermi surface parity with spin resolved transverse magnetic focussing
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2310.04005