Numerical simulation of defect states and electron transport mechanisms in amorphous oxide thin film transistors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Saha, D., Kulkarni, Sachin
Format:	Preprint
Published:	2023
Subjects:	Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2310.04707