Grome, C. A., & Ji, W. (2023). A Brief Review of Single Event Burnout Failure Mechanisms and Design Tolerances of Silicon Carbide MOSFETs.
Chicago Style (17th ed.) CitationGrome, Christopher A., and Wei Ji. A Brief Review of Single Event Burnout Failure Mechanisms and Design Tolerances of Silicon Carbide MOSFETs. 2023.
MLA (9th ed.) CitationGrome, Christopher A., and Wei Ji. A Brief Review of Single Event Burnout Failure Mechanisms and Design Tolerances of Silicon Carbide MOSFETs. 2023.
Warning: These citations may not always be 100% accurate.