A RISC-V MCU with adaptive reverse body bias and ultra-low-power retention mode in 22 nm FD-SOI

Fuente: arXiv
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Bibliographic Details
Main Authors: Bauer, Heiner, Stolba, Marco, Scholze, Stefan, Walter, Dennis, Mayr, Christian, Oefelein, Alexander, Höppner, Sebastian, Scharfe, André, Schraut, Flo, Eisenreich, Holger
Format: Preprint
Published: 2023
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_version_ 1866916110654242816
author Bauer, Heiner
Stolba, Marco
Scholze, Stefan
Walter, Dennis
Mayr, Christian
Oefelein, Alexander
Höppner, Sebastian
Scharfe, André
Schraut, Flo
Eisenreich, Holger
author_facet Bauer, Heiner
Stolba, Marco
Scholze, Stefan
Walter, Dennis
Mayr, Christian
Oefelein, Alexander
Höppner, Sebastian
Scharfe, André
Schraut, Flo
Eisenreich, Holger
contents We present a low-power, energy efficient 32-bit RISC-V microprocessor unit (MCU) in 22 nm FD-SOI. It achieves ultra-low leakage,even at high temperatures, by using an adaptive reverse body biasing aware sign-off approach, a low-power optimized physical implementation, and custom SRAM macros with retention mode. We demonstrate the robustness of the chip with measurements over the full industrial temperature range, from -40 °C to 125 °C. Our results match the state of the art (SOTA) with 4.8 uW / MHz at 50 MHz in active mode and surpass the SOTA in ultra-low-power retention mode.
format Preprint
id arxiv_https___arxiv_org_abs_2310_09094
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle A RISC-V MCU with adaptive reverse body bias and ultra-low-power retention mode in 22 nm FD-SOI
Bauer, Heiner
Stolba, Marco
Scholze, Stefan
Walter, Dennis
Mayr, Christian
Oefelein, Alexander
Höppner, Sebastian
Scharfe, André
Schraut, Flo
Eisenreich, Holger
Hardware Architecture
We present a low-power, energy efficient 32-bit RISC-V microprocessor unit (MCU) in 22 nm FD-SOI. It achieves ultra-low leakage,even at high temperatures, by using an adaptive reverse body biasing aware sign-off approach, a low-power optimized physical implementation, and custom SRAM macros with retention mode. We demonstrate the robustness of the chip with measurements over the full industrial temperature range, from -40 °C to 125 °C. Our results match the state of the art (SOTA) with 4.8 uW / MHz at 50 MHz in active mode and surpass the SOTA in ultra-low-power retention mode.
title A RISC-V MCU with adaptive reverse body bias and ultra-low-power retention mode in 22 nm FD-SOI
topic Hardware Architecture
url https://arxiv.org/abs/2310.09094