High-resolution ptychographic imaging at a seeded free-electron laser source using OAM beams

Fuente: arXiv
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Autori principali: Pancaldi, M., Guzzi, F., Bevis, C. S., Manfredda, M., Barolak, J., Bonetti, S., Bykova, I., De Angelis, D., De Ninno, G., Fanciulli, M., Novinec, L., Pedersoli, E., Ravindran, A., Rösner, B., David, C., Ruchon, T., Simoncig, A., Zangrando, M., Adams, D. E., Vavassori, P., Sacchi, M., Kourousias, G., Mancini, G. F., Capotondi, F.
Natura: Preprint
Pubblicazione: 2023
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author Pancaldi, M.
Guzzi, F.
Bevis, C. S.
Manfredda, M.
Barolak, J.
Bonetti, S.
Bykova, I.
De Angelis, D.
De Ninno, G.
Fanciulli, M.
Novinec, L.
Pedersoli, E.
Ravindran, A.
Rösner, B.
David, C.
Ruchon, T.
Simoncig, A.
Zangrando, M.
Adams, D. E.
Vavassori, P.
Sacchi, M.
Kourousias, G.
Mancini, G. F.
Capotondi, F.
author_facet Pancaldi, M.
Guzzi, F.
Bevis, C. S.
Manfredda, M.
Barolak, J.
Bonetti, S.
Bykova, I.
De Angelis, D.
De Ninno, G.
Fanciulli, M.
Novinec, L.
Pedersoli, E.
Ravindran, A.
Rösner, B.
David, C.
Ruchon, T.
Simoncig, A.
Zangrando, M.
Adams, D. E.
Vavassori, P.
Sacchi, M.
Kourousias, G.
Mancini, G. F.
Capotondi, F.
contents Electromagnetic waves possessing orbital angular momentum (OAM) are powerful tools for applications in optical communications, new quantum technologies and optical tweezers. Recently, they have attracted growing interest since they can be harnessed to detect peculiar helical dichroic effects in chiral molecular media and in magnetic nanostructures. In this work, we perform single-shot per position ptychography on a nanostructured object at a seeded free-electron laser, using extreme ultraviolet OAM beams of different topological charge order $\ell$ generated with spiral zone plates. By controlling $\ell$, we demonstrate how the structural features of OAM beam profile determine an improvement of about 30% in image resolution with respect to conventional Gaussian beam illumination. This result extends the capabilities of coherent diffraction imaging techniques, and paves the way for achieving time-resolved high-resolution (below 100 nm) microscopy on large area samples.
format Preprint
id arxiv_https___arxiv_org_abs_2310_11773
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle High-resolution ptychographic imaging at a seeded free-electron laser source using OAM beams
Pancaldi, M.
Guzzi, F.
Bevis, C. S.
Manfredda, M.
Barolak, J.
Bonetti, S.
Bykova, I.
De Angelis, D.
De Ninno, G.
Fanciulli, M.
Novinec, L.
Pedersoli, E.
Ravindran, A.
Rösner, B.
David, C.
Ruchon, T.
Simoncig, A.
Zangrando, M.
Adams, D. E.
Vavassori, P.
Sacchi, M.
Kourousias, G.
Mancini, G. F.
Capotondi, F.
Optics
Electromagnetic waves possessing orbital angular momentum (OAM) are powerful tools for applications in optical communications, new quantum technologies and optical tweezers. Recently, they have attracted growing interest since they can be harnessed to detect peculiar helical dichroic effects in chiral molecular media and in magnetic nanostructures. In this work, we perform single-shot per position ptychography on a nanostructured object at a seeded free-electron laser, using extreme ultraviolet OAM beams of different topological charge order $\ell$ generated with spiral zone plates. By controlling $\ell$, we demonstrate how the structural features of OAM beam profile determine an improvement of about 30% in image resolution with respect to conventional Gaussian beam illumination. This result extends the capabilities of coherent diffraction imaging techniques, and paves the way for achieving time-resolved high-resolution (below 100 nm) microscopy on large area samples.
title High-resolution ptychographic imaging at a seeded free-electron laser source using OAM beams
topic Optics
url https://arxiv.org/abs/2310.11773