Coulomb contribution to Shockley-Read-Hall (SRH) recombination

Fuente: arXiv
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Main Authors: Sakowski, Konrad, Strak, Pawel, Kempisty, Pawel, Piechota, Jacek, Grzegory, Izabella, Perlin, Piotr, Monroy, Eva, Kaminska, Agata, Krukowski, Stanislaw
Format: Preprint
Published: 2023
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author Sakowski, Konrad
Strak, Pawel
Kempisty, Pawel
Piechota, Jacek
Grzegory, Izabella
Perlin, Piotr
Monroy, Eva
Kaminska, Agata
Krukowski, Stanislaw
author_facet Sakowski, Konrad
Strak, Pawel
Kempisty, Pawel
Piechota, Jacek
Grzegory, Izabella
Perlin, Piotr
Monroy, Eva
Kaminska, Agata
Krukowski, Stanislaw
contents Defect-mediated nonradiative recombination, known as Shockley-Read-Hall (SRH) recombination is reformulated. The introduced model considers Coulomb attraction between charged deep defect and the approaching free carrier, showing that this effect may cause considerable increase of the carrier velocity approaching the recombination center. The effect considerably increases the carrier capture rates. It is demonstrated that in the typical semiconductor device or semiconductor medium, the SRH recombination cannot be neglected at low temperatures. The SRH is more effective in the case of low doped semiconductors. Effective screening by mobile carrier density could reduce the effect, leading to SRH rate increase.
format Preprint
id arxiv_https___arxiv_org_abs_2310_11823
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Coulomb contribution to Shockley-Read-Hall (SRH) recombination
Sakowski, Konrad
Strak, Pawel
Kempisty, Pawel
Piechota, Jacek
Grzegory, Izabella
Perlin, Piotr
Monroy, Eva
Kaminska, Agata
Krukowski, Stanislaw
Materials Science
Defect-mediated nonradiative recombination, known as Shockley-Read-Hall (SRH) recombination is reformulated. The introduced model considers Coulomb attraction between charged deep defect and the approaching free carrier, showing that this effect may cause considerable increase of the carrier velocity approaching the recombination center. The effect considerably increases the carrier capture rates. It is demonstrated that in the typical semiconductor device or semiconductor medium, the SRH recombination cannot be neglected at low temperatures. The SRH is more effective in the case of low doped semiconductors. Effective screening by mobile carrier density could reduce the effect, leading to SRH rate increase.
title Coulomb contribution to Shockley-Read-Hall (SRH) recombination
topic Materials Science
url https://arxiv.org/abs/2310.11823