Achieving Single-Electron Sensitivity at Enhanced Speed in Fully-Depleted CCDs with Double-Gate MOSFETs

Fuente: arXiv
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Bibliographic Details
Main Authors: Sofo-Haro, Miguel, Donlon, Kevan, Estrada, Juan, Holland, Steve, Fahim, Farah, Leitz, Chris
Format: Preprint
Published: 2023
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