Breakdown Performance of Guard Ring Designs for Pixel Detectors in $150~\mathrm{nm}$ CMOS Technology

Fuente: arXiv
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Bibliographic Details
Main Authors: Zhang, Sinuo, Caicedo, Ivan, Hemperek, Tomasz, Hirono, Toko, Dingfelder, Jochen
Format: Preprint
Published: 2023
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