Unveiling microstructural damage for leakage current degradation in SiC Schottky diode after heavy ions irradiation under 200 V

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yan, Xiaoyu, Zhai, Pengfei, Yang, Chen, Zhao, Shiwei, Nan, Shuai, Hu, Peipei, Zhang, Teng, Chen, Qiyu, Xu, Lijun, Li, Zongzhen, Liu, Jie
Format:	Preprint
Published:	2023
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2310.17145