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Main Authors: Zhang, Hong-Yan, Feng, Zhi-Qiang, Liu, Haoting, Lin, Rui-Jia, Zhou, Yu
Format: Preprint
Published: 2023
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Online Access:https://arxiv.org/abs/2310.19576
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author Zhang, Hong-Yan
Feng, Zhi-Qiang
Liu, Haoting
Lin, Rui-Jia
Zhou, Yu
author_facet Zhang, Hong-Yan
Feng, Zhi-Qiang
Liu, Haoting
Lin, Rui-Jia
Zhou, Yu
contents Kuiper's $V_n$ statistic, a measure for comparing the difference of ideal distribution and empirical distribution, is of great significance in the goodness-of-fit test. However, Kuiper's formulae for computing the cumulative distribution function, false positive probability and the upper tail quantile of $V_n$ can not be applied to the case of small sample capacity $n$ since the approximation error is $\mathcal{O}(n^{-1})$. In this work, our contributions lie in three perspectives: firstly the approximation error is reduced to $\mathcal{O}(n^{-(k+1)/2})$ where $k$ is the expansion order with the \textit{high order expansion} for the exponent of differential operator; secondly, a novel high order formula with approximation error $\mathcal{O}(n^{-3})$ is obtained by massive calculations; thirdly, the fixed-point algorithms are designed for solving the Kuiper pair of critical values and upper tail quantiles based on the novel formula. The high order expansion method for Kuiper's $V_n$-statistic is applicable for various applications where there are more than five samples of data. The principles, algorithms and code for the high order expansion method are attractive for the goodness-of-fit test.\\ \textbf{Keywords}: Goodness-of-fit Methods, Kuiper's statistic, Quantile estimation, Algorithm design, High order expansion (HOE)
format Preprint
id arxiv_https___arxiv_org_abs_2310_19576
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle High Order Expansion Method for Kuiper's $V_n$ Statistic in Goodness-of-fit Test
Zhang, Hong-Yan
Feng, Zhi-Qiang
Liu, Haoting
Lin, Rui-Jia
Zhou, Yu
Statistics Theory
Kuiper's $V_n$ statistic, a measure for comparing the difference of ideal distribution and empirical distribution, is of great significance in the goodness-of-fit test. However, Kuiper's formulae for computing the cumulative distribution function, false positive probability and the upper tail quantile of $V_n$ can not be applied to the case of small sample capacity $n$ since the approximation error is $\mathcal{O}(n^{-1})$. In this work, our contributions lie in three perspectives: firstly the approximation error is reduced to $\mathcal{O}(n^{-(k+1)/2})$ where $k$ is the expansion order with the \textit{high order expansion} for the exponent of differential operator; secondly, a novel high order formula with approximation error $\mathcal{O}(n^{-3})$ is obtained by massive calculations; thirdly, the fixed-point algorithms are designed for solving the Kuiper pair of critical values and upper tail quantiles based on the novel formula. The high order expansion method for Kuiper's $V_n$-statistic is applicable for various applications where there are more than five samples of data. The principles, algorithms and code for the high order expansion method are attractive for the goodness-of-fit test.\\ \textbf{Keywords}: Goodness-of-fit Methods, Kuiper's statistic, Quantile estimation, Algorithm design, High order expansion (HOE)
title High Order Expansion Method for Kuiper's $V_n$ Statistic in Goodness-of-fit Test
topic Statistics Theory
url https://arxiv.org/abs/2310.19576