Method of Mechanical Exfoliation of Bismuth with Micro-Trench Structures
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arXiv
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| Autores principales: | , , , , , , , |
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| Formato: | Preprint |
| Publicado: |
2023
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| _version_ | 1866910473575727104 |
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| author | Yu, Oulin Allgayer, Raphaela Godin, Simon Lalande, Jacob Fossati, Paolo Hsu, Chunwei Szkopek, Thomas Gervais, Guillaume |
| author_facet | Yu, Oulin Allgayer, Raphaela Godin, Simon Lalande, Jacob Fossati, Paolo Hsu, Chunwei Szkopek, Thomas Gervais, Guillaume |
| contents | The discovery of graphene led to a burst in search for 2D materials originating from layered atomic crystals coupled by van der Waals force. While bulk bismuth crystals share this layered crystal structure, unlike other group V members of the periodic table, its interlayer bonds are stronger such that traditional mechanical cleavage and exfoliation techniques have shown to be inefficient. In this work, we present a novel mechanical cleavage method for exfoliating bismuth by utilizing the stress concentration effect induced by micro-trench SiO2 structures. As a result, the exfoliated bismuth flakes can achieve thicknesses down to the sub-10 nm range which are analyzed by AFM and Raman spectroscopy. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2311_01321 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Method of Mechanical Exfoliation of Bismuth with Micro-Trench Structures Yu, Oulin Allgayer, Raphaela Godin, Simon Lalande, Jacob Fossati, Paolo Hsu, Chunwei Szkopek, Thomas Gervais, Guillaume Mesoscale and Nanoscale Physics Materials Science The discovery of graphene led to a burst in search for 2D materials originating from layered atomic crystals coupled by van der Waals force. While bulk bismuth crystals share this layered crystal structure, unlike other group V members of the periodic table, its interlayer bonds are stronger such that traditional mechanical cleavage and exfoliation techniques have shown to be inefficient. In this work, we present a novel mechanical cleavage method for exfoliating bismuth by utilizing the stress concentration effect induced by micro-trench SiO2 structures. As a result, the exfoliated bismuth flakes can achieve thicknesses down to the sub-10 nm range which are analyzed by AFM and Raman spectroscopy. |
| title | Method of Mechanical Exfoliation of Bismuth with Micro-Trench Structures |
| topic | Mesoscale and Nanoscale Physics Materials Science |
| url | https://arxiv.org/abs/2311.01321 |