Two Complementary Perspectives to Continual Learning: Ask Not Only What to Optimize, But Also How

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hess, Timm, Tuytelaars, Tinne, van de Ven, Gido M.
Format:	Preprint
Published:	2023
Subjects:	Machine Learning Artificial Intelligence Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2311.04898