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| Main Authors: | , , |
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| Format: | Preprint |
| Published: |
2023
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2311.11378 |
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| _version_ | 1866915250281906176 |
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| author | Nguyen, Hoang C. Lee, Haeil Kim, Junmo |
| author_facet | Nguyen, Hoang C. Lee, Haeil Kim, Junmo |
| contents | Transformer becomes more popular in the vision domain in recent years so there is a need for finding an effective way to interpret the Transformer model by visualizing it. In recent work, Chefer et al. can visualize the Transformer on vision and multi-modal tasks effectively by combining attention layers to show the importance of each image patch. However, when applying to other variants of Transformer such as the Swin Transformer, this method can not focus on the predicted object. Our method, by considering the statistics of tokens in layer normalization layers, shows a great ability to interpret the explainability of Swin Transformer and ViT. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2311_11378 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Inspecting Explainability of Transformer Models with Additional Statistical Information Nguyen, Hoang C. Lee, Haeil Kim, Junmo Computer Vision and Pattern Recognition Artificial Intelligence Transformer becomes more popular in the vision domain in recent years so there is a need for finding an effective way to interpret the Transformer model by visualizing it. In recent work, Chefer et al. can visualize the Transformer on vision and multi-modal tasks effectively by combining attention layers to show the importance of each image patch. However, when applying to other variants of Transformer such as the Swin Transformer, this method can not focus on the predicted object. Our method, by considering the statistics of tokens in layer normalization layers, shows a great ability to interpret the explainability of Swin Transformer and ViT. |
| title | Inspecting Explainability of Transformer Models with Additional Statistical Information |
| topic | Computer Vision and Pattern Recognition Artificial Intelligence |
| url | https://arxiv.org/abs/2311.11378 |