Magnetic penetration depth of Aluminum thin films
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arXiv
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| Format: | Preprint |
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2023
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| _version_ | 1866911158427975680 |
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| author | López-Núñez, David Torras-Coloma, Alba Montserrat, Queralt Portell Bertoldo, Elia Cozzolino, Luca Rius, Gemma Martínez, M. Forn-Díaz, P. |
| author_facet | López-Núñez, David Torras-Coloma, Alba Montserrat, Queralt Portell Bertoldo, Elia Cozzolino, Luca Rius, Gemma Martínez, M. Forn-Díaz, P. |
| contents | We present a study of the superconducting penetration depth $λ$ in aluminum thin films of varying thickness. The range of thicknesses chosen spans from the thin-film regime to the regime approaching bulk behavior. The penetration depths observed range from $λ= 163.3\pm0.4~\rm{nm}$ for the thinnest $20~\rm{nm}$ samples down to $λ= 53.6\pm0.4~\rm{nm}$ for the $200~\rm{nm}$-thick ones. In order to accurately determine $λ$, we performed complementary measurements using the frequency of superconducting $LC$ resonators as well as the resistance of normal-state meanders. Both methods yield comparable results, providing a well-characterized set of values of $λ$ in aluminum in the relevant range for applications in fields such as quantum computing and microwave radiation detector technologies. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2311_14119 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Magnetic penetration depth of Aluminum thin films López-Núñez, David Torras-Coloma, Alba Montserrat, Queralt Portell Bertoldo, Elia Cozzolino, Luca Rius, Gemma Martínez, M. Forn-Díaz, P. Superconductivity Quantum Physics We present a study of the superconducting penetration depth $λ$ in aluminum thin films of varying thickness. The range of thicknesses chosen spans from the thin-film regime to the regime approaching bulk behavior. The penetration depths observed range from $λ= 163.3\pm0.4~\rm{nm}$ for the thinnest $20~\rm{nm}$ samples down to $λ= 53.6\pm0.4~\rm{nm}$ for the $200~\rm{nm}$-thick ones. In order to accurately determine $λ$, we performed complementary measurements using the frequency of superconducting $LC$ resonators as well as the resistance of normal-state meanders. Both methods yield comparable results, providing a well-characterized set of values of $λ$ in aluminum in the relevant range for applications in fields such as quantum computing and microwave radiation detector technologies. |
| title | Magnetic penetration depth of Aluminum thin films |
| topic | Superconductivity Quantum Physics |
| url | https://arxiv.org/abs/2311.14119 |