Mid-infrared optical coherence tomography with MHz axial line rate for real-time non-destructive testing
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arXiv
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| Main Authors: | , , , , |
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| Format: | Preprint |
| Published: |
2023
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| _version_ | 1866915271650836480 |
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| author | Yagi, Satoko Nakamura, Takuma Hashimoto, Kazuki Kawano, Shotaro Ideguchi, Takuro |
| author_facet | Yagi, Satoko Nakamura, Takuma Hashimoto, Kazuki Kawano, Shotaro Ideguchi, Takuro |
| contents | Non-destructive testing (NDT) is crucial for ensuring product quality and safety across various industries. Conventional methods such as ultrasonic, terahertz, and X-ray imaging have limitations in terms of probe-contact requirement, depth resolution, or radiation risks. Optical coherence tomography (OCT) is a promising alternative to solve these limitations, but it suffers from strong scattering, limiting its penetration depth. Recently, OCT in the mid-infrared (MIR) spectral region has attracted attention with a significantly lower scattering rate than in the near-infrared region. However, the highest reported A-scan rate of MIR-OCT has been 3 kHz, which requires long data acquisition time to take an image, unsatisfying industrial demands for real-time diagnosis. Here, we present a high-speed MIR-OCT system operating in the 3-4 um region that employs the swept-source OCT technique based on time-stretch infrared spectroscopy. By integrating a broadband femtosecond MIR pulsed laser operating at a repetition rate of 50 MHz, we achieved an A-scan rate of 1 MHz with an axial resolution of 11.6 um and a sensitivity of 55 dB. As a proof-of-concept demonstration, we imaged the surface of substrates covered by highly scattering paint coatings. The demonstrated A-scan rate surpasses previous state-of-the-art by more than two orders of magnitude, paving the way for real-time NDT of industrial products, cultural assets, and structures. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2312_02408 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Mid-infrared optical coherence tomography with MHz axial line rate for real-time non-destructive testing Yagi, Satoko Nakamura, Takuma Hashimoto, Kazuki Kawano, Shotaro Ideguchi, Takuro Optics Instrumentation and Detectors Non-destructive testing (NDT) is crucial for ensuring product quality and safety across various industries. Conventional methods such as ultrasonic, terahertz, and X-ray imaging have limitations in terms of probe-contact requirement, depth resolution, or radiation risks. Optical coherence tomography (OCT) is a promising alternative to solve these limitations, but it suffers from strong scattering, limiting its penetration depth. Recently, OCT in the mid-infrared (MIR) spectral region has attracted attention with a significantly lower scattering rate than in the near-infrared region. However, the highest reported A-scan rate of MIR-OCT has been 3 kHz, which requires long data acquisition time to take an image, unsatisfying industrial demands for real-time diagnosis. Here, we present a high-speed MIR-OCT system operating in the 3-4 um region that employs the swept-source OCT technique based on time-stretch infrared spectroscopy. By integrating a broadband femtosecond MIR pulsed laser operating at a repetition rate of 50 MHz, we achieved an A-scan rate of 1 MHz with an axial resolution of 11.6 um and a sensitivity of 55 dB. As a proof-of-concept demonstration, we imaged the surface of substrates covered by highly scattering paint coatings. The demonstrated A-scan rate surpasses previous state-of-the-art by more than two orders of magnitude, paving the way for real-time NDT of industrial products, cultural assets, and structures. |
| title | Mid-infrared optical coherence tomography with MHz axial line rate for real-time non-destructive testing |
| topic | Optics Instrumentation and Detectors |
| url | https://arxiv.org/abs/2312.02408 |