Test-negative designs with various reasons for testing: statistical bias and solution

Fuente: arXiv
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Bibliographic Details
Main Authors: Yu, Mengxin, Liu, Tom Hongyi, Li, Kendrick Qijun, Jewell, Nicholas, Tchetgen, Eric Tchetgen, Small, Dylan, Shi, Xu, Wang, Bingkai
Format: Preprint
Published: 2023
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