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Autores principales: Mohelsky, I., Wyzula, J., Mardele, F. Le, Abadizaman, F., Caha, O., Dubroka, A., Sun, X. D., Cho, C. W., Piot, B. A., Tanzim, M. F., Aguilera, I., Bauer, G., Springholz, G., Orlita, M.
Formato: Preprint
Publicado: 2023
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Acceso en línea:https://arxiv.org/abs/2312.07402
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author Mohelsky, I.
Wyzula, J.
Mardele, F. Le
Abadizaman, F.
Caha, O.
Dubroka, A.
Sun, X. D.
Cho, C. W.
Piot, B. A.
Tanzim, M. F.
Aguilera, I.
Bauer, G.
Springholz, G.
Orlita, M.
author_facet Mohelsky, I.
Wyzula, J.
Mardele, F. Le
Abadizaman, F.
Caha, O.
Dubroka, A.
Sun, X. D.
Cho, C. W.
Piot, B. A.
Tanzim, M. F.
Aguilera, I.
Bauer, G.
Springholz, G.
Orlita, M.
contents Here we report on Landau level spectroscopy of an epitaxially grown thin film of the topological insulator Sb2Te3, complemented by ellipsometry and magneto-transport measurements. The observed response suggests that Sb2Te3 is a direct-gap semiconductor with the fundamental band gap located at the Γpoint, or along the trigonal axis, and its width reaches Eg = 190 meV at low temperatures. Our data also indicate the presence of other low-energy extrema with a higher multiplicity in both the conduction and valence bands. The conclusions based on our experimental data are confronted with and to a great extent corroborated by the electronic band structure calculated using the GW method.
format Preprint
id arxiv_https___arxiv_org_abs_2312_07402
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Electronic band structure of Sb2Te3
Mohelsky, I.
Wyzula, J.
Mardele, F. Le
Abadizaman, F.
Caha, O.
Dubroka, A.
Sun, X. D.
Cho, C. W.
Piot, B. A.
Tanzim, M. F.
Aguilera, I.
Bauer, G.
Springholz, G.
Orlita, M.
Materials Science
Here we report on Landau level spectroscopy of an epitaxially grown thin film of the topological insulator Sb2Te3, complemented by ellipsometry and magneto-transport measurements. The observed response suggests that Sb2Te3 is a direct-gap semiconductor with the fundamental band gap located at the Γpoint, or along the trigonal axis, and its width reaches Eg = 190 meV at low temperatures. Our data also indicate the presence of other low-energy extrema with a higher multiplicity in both the conduction and valence bands. The conclusions based on our experimental data are confronted with and to a great extent corroborated by the electronic band structure calculated using the GW method.
title Electronic band structure of Sb2Te3
topic Materials Science
url https://arxiv.org/abs/2312.07402