APA (7th ed.) Citation

Rafighdoost, J., Kolenov, D., & Pereira, S. F. (2023). Coherent Fourier Scatterometry for detection of killer defects on silicon carbide samples.

Chicago Style (17th ed.) Citation

Rafighdoost, Jila, Dmytro Kolenov, and Silvania F. Pereira. Coherent Fourier Scatterometry for Detection of Killer Defects on Silicon Carbide Samples. 2023.

MLA (9th ed.) Citation

Rafighdoost, Jila, et al. Coherent Fourier Scatterometry for Detection of Killer Defects on Silicon Carbide Samples. 2023.