High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter

Fuente: arXiv
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Auteurs principaux: Mizumoto, Misaki, Tsujimoto, Masahiro, Cumbee, Renata S., Eckart, Megan E., Ishisaki, Yoshitaka, Kilbourne, Caroline A., Hodges-Kluck, Edmund, Leutenegger, Maurice A., Porter, Frederick S., Sawada, Makoto, Takei, Yoh, Uchida, Yuusuke, Yamada, Shin'ya, team, the XRISM Resolve
Format: Preprint
Publié: 2023
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author Mizumoto, Misaki
Tsujimoto, Masahiro
Cumbee, Renata S.
Eckart, Megan E.
Ishisaki, Yoshitaka
Kilbourne, Caroline A.
Hodges-Kluck, Edmund
Leutenegger, Maurice A.
Porter, Frederick S.
Sawada, Makoto
Takei, Yoh
Uchida, Yuusuke
Yamada, Shin'ya
team, the XRISM Resolve
author_facet Mizumoto, Misaki
Tsujimoto, Masahiro
Cumbee, Renata S.
Eckart, Megan E.
Ishisaki, Yoshitaka
Kilbourne, Caroline A.
Hodges-Kluck, Edmund
Leutenegger, Maurice A.
Porter, Frederick S.
Sawada, Makoto
Takei, Yoh
Uchida, Yuusuke
Yamada, Shin'ya
team, the XRISM Resolve
contents The spectroscopic performance of x-ray instruments can be affected at high count rates. The effects and mitigation in the optical chain, such as x-ray attenuation filters or de-focusing mirrors, are widely discussed, but those in the signal chain are not. Using the Resolve x-ray microcalorimeter onboard the XRISM satellite, we discuss the effects observed during high count rate measurements and how these can be modeled. We focus on three instrumental effects that impact performance at high count rate: CPU limit, pile up, and electrical cross talk. High count rate data were obtained during ground testing using the flight model instrument and a calibration x-ray source. A simulated observation of GX 13+1 is presented to illustrate how to estimate these effects based on these models for observation planning. The impact of these effects on high count rate observations is discussed.
format Preprint
id arxiv_https___arxiv_org_abs_2312_15588
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter
Mizumoto, Misaki
Tsujimoto, Masahiro
Cumbee, Renata S.
Eckart, Megan E.
Ishisaki, Yoshitaka
Kilbourne, Caroline A.
Hodges-Kluck, Edmund
Leutenegger, Maurice A.
Porter, Frederick S.
Sawada, Makoto
Takei, Yoh
Uchida, Yuusuke
Yamada, Shin'ya
team, the XRISM Resolve
Instrumentation and Methods for Astrophysics
The spectroscopic performance of x-ray instruments can be affected at high count rates. The effects and mitigation in the optical chain, such as x-ray attenuation filters or de-focusing mirrors, are widely discussed, but those in the signal chain are not. Using the Resolve x-ray microcalorimeter onboard the XRISM satellite, we discuss the effects observed during high count rate measurements and how these can be modeled. We focus on three instrumental effects that impact performance at high count rate: CPU limit, pile up, and electrical cross talk. High count rate data were obtained during ground testing using the flight model instrument and a calibration x-ray source. A simulated observation of GX 13+1 is presented to illustrate how to estimate these effects based on these models for observation planning. The impact of these effects on high count rate observations is discussed.
title High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter
topic Instrumentation and Methods for Astrophysics
url https://arxiv.org/abs/2312.15588