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Main Authors: Sakakura, Terutoshi, Ishikawa, Yoshihisa, Kishimoto, Shunji, Takenaka, Yasuyuki, Tanaka, Kiyoaki, Miyasaka, Shigeki, Tokura, Yoshinori, Noda, Yukio, Ishizawa, Nobuo, Sagayama, Hajime, Yamamoto, Hajime, Kimura, Hiroyuki
Format: Preprint
Published: 2023
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Online Access:https://arxiv.org/abs/2401.00412
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author Sakakura, Terutoshi
Ishikawa, Yoshihisa
Kishimoto, Shunji
Takenaka, Yasuyuki
Tanaka, Kiyoaki
Miyasaka, Shigeki
Tokura, Yoshinori
Noda, Yukio
Ishizawa, Nobuo
Sagayama, Hajime
Yamamoto, Hajime
Kimura, Hiroyuki
author_facet Sakakura, Terutoshi
Ishikawa, Yoshihisa
Kishimoto, Shunji
Takenaka, Yasuyuki
Tanaka, Kiyoaki
Miyasaka, Shigeki
Tokura, Yoshinori
Noda, Yukio
Ishizawa, Nobuo
Sagayama, Hajime
Yamamoto, Hajime
Kimura, Hiroyuki
contents The theoretically observable limit of electron density distribution by single-crystal X-ray diffraction is discussed. When F_{orb} and δF are defined as, respectively, the partial structure factor for an orbital and the deviation of the observed F from the true F, the accuracy of electron density attributable to F_{orb} is chiefly determined by the number of reflections satisfying the condition F_{orb}/F > δF/F. Since F_{orb}/F, which is generally small for crystals with large F(0,0,0), is constant under a given set of experimental conditions, δF/F must be reduced to increase the number of reflections satisfying F_{orb}/F > δF/F. The present paper demonstrates how to reduce δF mathematically and experimentally, and the following topics are covered: the Poisson statistics, accumulation of errors in the data collection and reduction procedure, multiple diffraction, conversion error from F^2 to F in refinement programs, which is unavoidable when the input quantities have different dimension from F, weighting of reflections, and tips. For demonstration, observation of the electron density of the Ti-3d^1 orbital in YTiO_3 by synchrotron single-crystal X-ray diffraction is presented.
format Preprint
id arxiv_https___arxiv_org_abs_2401_00412
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Toward the theoretically observable limit of electron density distribution by single-crystal synchrotron X-ray diffraction: The case of orbitally ordered Ti-3d^1 in YTiO_3
Sakakura, Terutoshi
Ishikawa, Yoshihisa
Kishimoto, Shunji
Takenaka, Yasuyuki
Tanaka, Kiyoaki
Miyasaka, Shigeki
Tokura, Yoshinori
Noda, Yukio
Ishizawa, Nobuo
Sagayama, Hajime
Yamamoto, Hajime
Kimura, Hiroyuki
Materials Science
The theoretically observable limit of electron density distribution by single-crystal X-ray diffraction is discussed. When F_{orb} and δF are defined as, respectively, the partial structure factor for an orbital and the deviation of the observed F from the true F, the accuracy of electron density attributable to F_{orb} is chiefly determined by the number of reflections satisfying the condition F_{orb}/F > δF/F. Since F_{orb}/F, which is generally small for crystals with large F(0,0,0), is constant under a given set of experimental conditions, δF/F must be reduced to increase the number of reflections satisfying F_{orb}/F > δF/F. The present paper demonstrates how to reduce δF mathematically and experimentally, and the following topics are covered: the Poisson statistics, accumulation of errors in the data collection and reduction procedure, multiple diffraction, conversion error from F^2 to F in refinement programs, which is unavoidable when the input quantities have different dimension from F, weighting of reflections, and tips. For demonstration, observation of the electron density of the Ti-3d^1 orbital in YTiO_3 by synchrotron single-crystal X-ray diffraction is presented.
title Toward the theoretically observable limit of electron density distribution by single-crystal synchrotron X-ray diffraction: The case of orbitally ordered Ti-3d^1 in YTiO_3
topic Materials Science
url https://arxiv.org/abs/2401.00412