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Main Authors: Ang, Li, Rahim, Siti Khatijah Nor Abdul, Hamzah, Raseeda, Aminuddin, Raihah, Yousheng, Gao
Format: Preprint
Published: 2024
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Online Access:https://arxiv.org/abs/2401.01214
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author Ang, Li
Rahim, Siti Khatijah Nor Abdul
Hamzah, Raseeda
Aminuddin, Raihah
Yousheng, Gao
author_facet Ang, Li
Rahim, Siti Khatijah Nor Abdul
Hamzah, Raseeda
Aminuddin, Raihah
Yousheng, Gao
contents Traditional manual detection for solder joint defect is no longer applied during industrial production due to low efficiency, inconsistent evaluation, high cost and lack of real-time data. A new approach has been proposed to address the issues of low accuracy, high false detection rates and computational cost of solder joint defect detection in surface mount technology of industrial scenarios. The proposed solution is a hybrid attention mechanism designed specifically for the solder joint defect detection algorithm to improve quality control in the manufacturing process by increasing the accuracy while reducing the computational cost. The hybrid attention mechanism comprises a proposed enhanced multi-head self-attention and coordinate attention mechanisms increase the ability of attention networks to perceive contextual information and enhances the utilization range of network features. The coordinate attention mechanism enhances the connection between different channels and reduces location information loss. The hybrid attention mechanism enhances the capability of the network to perceive long-distance position information and learn local features. The improved algorithm model has good detection ability for solder joint defect detection, with mAP reaching 91.5%, 4.3% higher than the You Only Look Once version 5 algorithm and better than other comparative algorithms. Compared to other versions, mean Average Precision, Precision, Recall, and Frame per Seconds indicators have also improved. The improvement of detection accuracy can be achieved while meeting real-time detection requirements.
format Preprint
id arxiv_https___arxiv_org_abs_2401_01214
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle YOLO algorithm with hybrid attention feature pyramid network for solder joint defect detection
Ang, Li
Rahim, Siti Khatijah Nor Abdul
Hamzah, Raseeda
Aminuddin, Raihah
Yousheng, Gao
Computer Vision and Pattern Recognition
Traditional manual detection for solder joint defect is no longer applied during industrial production due to low efficiency, inconsistent evaluation, high cost and lack of real-time data. A new approach has been proposed to address the issues of low accuracy, high false detection rates and computational cost of solder joint defect detection in surface mount technology of industrial scenarios. The proposed solution is a hybrid attention mechanism designed specifically for the solder joint defect detection algorithm to improve quality control in the manufacturing process by increasing the accuracy while reducing the computational cost. The hybrid attention mechanism comprises a proposed enhanced multi-head self-attention and coordinate attention mechanisms increase the ability of attention networks to perceive contextual information and enhances the utilization range of network features. The coordinate attention mechanism enhances the connection between different channels and reduces location information loss. The hybrid attention mechanism enhances the capability of the network to perceive long-distance position information and learn local features. The improved algorithm model has good detection ability for solder joint defect detection, with mAP reaching 91.5%, 4.3% higher than the You Only Look Once version 5 algorithm and better than other comparative algorithms. Compared to other versions, mean Average Precision, Precision, Recall, and Frame per Seconds indicators have also improved. The improvement of detection accuracy can be achieved while meeting real-time detection requirements.
title YOLO algorithm with hybrid attention feature pyramid network for solder joint defect detection
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2401.01214