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Main Authors: Bertoldo, Joao P. C., Ameln, Dick, Vaidya, Ashwin, Akçay, Samet
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2401.01984
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_version_ 1866929554632736768
author Bertoldo, Joao P. C.
Ameln, Dick
Vaidya, Ashwin
Akçay, Samet
author_facet Bertoldo, Joao P. C.
Ameln, Dick
Vaidya, Ashwin
Akçay, Samet
contents Recent advances in visual anomaly detection research have seen AUROC and AUPRO scores on public benchmark datasets such as MVTec and VisA converge towards perfect recall, giving the impression that these benchmarks are near-solved. However, high AUROC and AUPRO scores do not always reflect qualitative performance, which limits the validity of these metrics in real-world applications. We argue that the artificial ceiling imposed by the lack of an adequate evaluation metric restrains progression of the field, and it is crucial that we revisit the evaluation metrics used to rate our algorithms. In response, we introduce Per-IMage Overlap (PIMO), a novel metric that addresses the shortcomings of AUROC and AUPRO. PIMO retains the recall-based nature of the existing metrics but introduces two distinctions: the assignment of curves (and respective area under the curve) is per-image, and its X-axis relies solely on normal images. Measuring recall per image simplifies instance score indexing and is more robust to noisy annotations. As we show, it also accelerates computation and enables the usage of statistical tests to compare models. By imposing low tolerance for false positives on normal images, PIMO provides an enhanced model validation procedure and highlights performance variations across datasets. Our experiments demonstrate that PIMO offers practical advantages and nuanced performance insights that redefine anomaly detection benchmarks -- notably challenging the perception that MVTec AD and VisA datasets have been solved by contemporary models. Available on GitHub: https://github.com/jpcbertoldo/aupimo.
format Preprint
id arxiv_https___arxiv_org_abs_2401_01984
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle AUPIMO: Redefining Visual Anomaly Detection Benchmarks with High Speed and Low Tolerance
Bertoldo, Joao P. C.
Ameln, Dick
Vaidya, Ashwin
Akçay, Samet
Computer Vision and Pattern Recognition
Recent advances in visual anomaly detection research have seen AUROC and AUPRO scores on public benchmark datasets such as MVTec and VisA converge towards perfect recall, giving the impression that these benchmarks are near-solved. However, high AUROC and AUPRO scores do not always reflect qualitative performance, which limits the validity of these metrics in real-world applications. We argue that the artificial ceiling imposed by the lack of an adequate evaluation metric restrains progression of the field, and it is crucial that we revisit the evaluation metrics used to rate our algorithms. In response, we introduce Per-IMage Overlap (PIMO), a novel metric that addresses the shortcomings of AUROC and AUPRO. PIMO retains the recall-based nature of the existing metrics but introduces two distinctions: the assignment of curves (and respective area under the curve) is per-image, and its X-axis relies solely on normal images. Measuring recall per image simplifies instance score indexing and is more robust to noisy annotations. As we show, it also accelerates computation and enables the usage of statistical tests to compare models. By imposing low tolerance for false positives on normal images, PIMO provides an enhanced model validation procedure and highlights performance variations across datasets. Our experiments demonstrate that PIMO offers practical advantages and nuanced performance insights that redefine anomaly detection benchmarks -- notably challenging the perception that MVTec AD and VisA datasets have been solved by contemporary models. Available on GitHub: https://github.com/jpcbertoldo/aupimo.
title AUPIMO: Redefining Visual Anomaly Detection Benchmarks with High Speed and Low Tolerance
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2401.01984