Site-Specific Plan-view (S)TEM Sample Preparation from Thin Films using a Dual-Beam FIB-SEM

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ghosh, Supriya, Liu, Fengdeng, Nair, Sreejith, Jalan, Bharat, Mkhoyan, K. Andre
Format:	Preprint
Published:	2024
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2401.02538