Efficient Test Data Generation for MC/DC with OCL and Search

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sartaj, Hassan, Iqbal, Muhammad Zohaib, Jilani, Atif Aftab Ahmed, Khan, Muhammad Uzair
Format:	Preprint
Published:	2024
Subjects:	Software Engineering Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2401.03469