Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ahmed, Soyed Tuhin, Hefenbrock, Michael, Prenat, Guillaume, Anghel, Lorena, Tahoori, Mehdi B.
Format:	Preprint
Published:	2024
Subjects:	Emerging Technologies Hardware Architecture Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2401.04744