Implications of Noise in Resistive Memory on Deep Neural Networks for Image Classification

Fuente: arXiv

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Bibliographic Details
Main Authors:	Emonds, Yannick, Xi, Kai, Fröning, Holger
Format:	Preprint
Published:	2024
Subjects:	Machine Learning Computer Vision and Pattern Recognition Emerging Technologies Performance
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2401.05820