Liu, X., Wang, Y., Han, Y., & Wu, X. (2024). Quantifying the intrinsic randomness in sequential measurements.
Style de citation Chicago (17e éd.)Liu, Xinjian, Yukun Wang, Yunguang Han, et Xia Wu. Quantifying the Intrinsic Randomness in Sequential Measurements. 2024.
Style de citation MLA (9e éd.)Liu, Xinjian, et al. Quantifying the Intrinsic Randomness in Sequential Measurements. 2024.
Attention : ces citations peuvent ne pas être correctes à 100%.