Operation Scheme Optimizations to Achieve Ultra-high Endurance (1010) in Flash Memory with Robust Reliabilities

Fuente: arXiv

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Bibliographic Details
Main Authors:	Feng, Yang, Sun, Zhaohui, Wang, Chengcheng, Guo, Xinyi, Mei, Junyao, Qi, Yueran, Liu, Jing, Zhang, Junyu, Wu, Jixuan, Zhan, Xuepeng, Chen, Jiezhi
Format:	Preprint
Published:	2024
Subjects:	Systems and Control
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2401.08120