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| Autori principali: | , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| Soggetti: | |
| Accesso online: | https://arxiv.org/abs/2401.08703 |
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| _version_ | 1866929223033159680 |
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| author | Wang, Guowei Ding, Changxing Tan, Wentao Tan, Mingkui |
| author_facet | Wang, Guowei Ding, Changxing Tan, Wentao Tan, Mingkui |
| contents | Test-time adaptation (TTA) is a task that continually adapts a pre-trained source model to the target domain during inference. One popular approach involves fine-tuning model with cross-entropy loss according to estimated pseudo-labels. However, its performance is significantly affected by noisy pseudo-labels. This study reveals that minimizing the classification error of each sample causes the cross-entropy loss's vulnerability to label noise. To address this issue, we propose a novel Decoupled Prototype Learning (DPL) method that features prototype-centric loss computation. First, we decouple the optimization of class prototypes. For each class prototype, we reduce its distance with positive samples and enlarge its distance with negative samples in a contrastive manner. This strategy prevents the model from overfitting to noisy pseudo-labels. Second, we propose a memory-based strategy to enhance DPL's robustness for the small batch sizes often encountered in TTA. We update each class's pseudo-feature from a memory in a momentum manner and insert an additional DPL loss. Finally, we introduce a consistency regularization-based approach to leverage samples with unconfident pseudo-labels. This approach transfers feature styles of samples with unconfident pseudo-labels to those with confident pseudo-labels. Thus, more reliable samples for TTA are created. The experimental results demonstrate that our methods achieve state-of-the-art performance on domain generalization benchmarks, and reliably improve the performance of self-training-based methods on image corruption benchmarks. The code will be released. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2401_08703 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Decoupled Prototype Learning for Reliable Test-Time Adaptation Wang, Guowei Ding, Changxing Tan, Wentao Tan, Mingkui Machine Learning Test-time adaptation (TTA) is a task that continually adapts a pre-trained source model to the target domain during inference. One popular approach involves fine-tuning model with cross-entropy loss according to estimated pseudo-labels. However, its performance is significantly affected by noisy pseudo-labels. This study reveals that minimizing the classification error of each sample causes the cross-entropy loss's vulnerability to label noise. To address this issue, we propose a novel Decoupled Prototype Learning (DPL) method that features prototype-centric loss computation. First, we decouple the optimization of class prototypes. For each class prototype, we reduce its distance with positive samples and enlarge its distance with negative samples in a contrastive manner. This strategy prevents the model from overfitting to noisy pseudo-labels. Second, we propose a memory-based strategy to enhance DPL's robustness for the small batch sizes often encountered in TTA. We update each class's pseudo-feature from a memory in a momentum manner and insert an additional DPL loss. Finally, we introduce a consistency regularization-based approach to leverage samples with unconfident pseudo-labels. This approach transfers feature styles of samples with unconfident pseudo-labels to those with confident pseudo-labels. Thus, more reliable samples for TTA are created. The experimental results demonstrate that our methods achieve state-of-the-art performance on domain generalization benchmarks, and reliably improve the performance of self-training-based methods on image corruption benchmarks. The code will be released. |
| title | Decoupled Prototype Learning for Reliable Test-Time Adaptation |
| topic | Machine Learning |
| url | https://arxiv.org/abs/2401.08703 |