OMG-Seg: Is One Model Good Enough For All Segmentation?

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Xiangtai, Yuan, Haobo, Li, Wei, Ding, Henghui, Wu, Size, Zhang, Wenwei, Li, Yining, Chen, Kai, Loy, Chen Change
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2401.10229