Multi-View Neural 3D Reconstruction of Micro-/Nanostructures with Atomic Force Microscopy
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arXiv
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| Main Authors: | , , , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866914647139942400 |
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| author | Chen, Shuo Peng, Mao Li, Yijin Ju, Bing-Feng Bao, Hujun Chen, Yuan-Liu Zhang, Guofeng |
| author_facet | Chen, Shuo Peng, Mao Li, Yijin Ju, Bing-Feng Bao, Hujun Chen, Yuan-Liu Zhang, Guofeng |
| contents | Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete sample topography capturing and tip-sample convolution artifacts. Here, we propose a multi-view neural-network-based framework with AFM (MVN-AFM), which accurately reconstructs surface models of intricate micro-/nanostructures. Unlike previous works, MVN-AFM does not depend on any specially shaped probes or costly modifications to the AFM system. To achieve this, MVN-AFM uniquely employs an iterative method to align multi-view data and eliminate AFM artifacts simultaneously. Furthermore, we pioneer the application of neural implicit surface reconstruction in nanotechnology and achieve markedly improved results. Extensive experiments show that MVN-AFM effectively eliminates artifacts present in raw AFM images and reconstructs various micro-/nanostructures including complex geometrical microstructures printed via Two-photon Lithography and nanoparticles such as PMMA nanospheres and ZIF-67 nanocrystals. This work presents a cost-effective tool for micro-/nanoscale 3D analysis. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2401_11541 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Multi-View Neural 3D Reconstruction of Micro-/Nanostructures with Atomic Force Microscopy Chen, Shuo Peng, Mao Li, Yijin Ju, Bing-Feng Bao, Hujun Chen, Yuan-Liu Zhang, Guofeng Computer Vision and Pattern Recognition Materials Science Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete sample topography capturing and tip-sample convolution artifacts. Here, we propose a multi-view neural-network-based framework with AFM (MVN-AFM), which accurately reconstructs surface models of intricate micro-/nanostructures. Unlike previous works, MVN-AFM does not depend on any specially shaped probes or costly modifications to the AFM system. To achieve this, MVN-AFM uniquely employs an iterative method to align multi-view data and eliminate AFM artifacts simultaneously. Furthermore, we pioneer the application of neural implicit surface reconstruction in nanotechnology and achieve markedly improved results. Extensive experiments show that MVN-AFM effectively eliminates artifacts present in raw AFM images and reconstructs various micro-/nanostructures including complex geometrical microstructures printed via Two-photon Lithography and nanoparticles such as PMMA nanospheres and ZIF-67 nanocrystals. This work presents a cost-effective tool for micro-/nanoscale 3D analysis. |
| title | Multi-View Neural 3D Reconstruction of Micro-/Nanostructures with Atomic Force Microscopy |
| topic | Computer Vision and Pattern Recognition Materials Science |
| url | https://arxiv.org/abs/2401.11541 |