Multi-View Neural 3D Reconstruction of Micro-/Nanostructures with Atomic Force Microscopy

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Chen, Shuo, Peng, Mao, Li, Yijin, Ju, Bing-Feng, Bao, Hujun, Chen, Yuan-Liu, Zhang, Guofeng
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866914647139942400
author Chen, Shuo
Peng, Mao
Li, Yijin
Ju, Bing-Feng
Bao, Hujun
Chen, Yuan-Liu
Zhang, Guofeng
author_facet Chen, Shuo
Peng, Mao
Li, Yijin
Ju, Bing-Feng
Bao, Hujun
Chen, Yuan-Liu
Zhang, Guofeng
contents Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete sample topography capturing and tip-sample convolution artifacts. Here, we propose a multi-view neural-network-based framework with AFM (MVN-AFM), which accurately reconstructs surface models of intricate micro-/nanostructures. Unlike previous works, MVN-AFM does not depend on any specially shaped probes or costly modifications to the AFM system. To achieve this, MVN-AFM uniquely employs an iterative method to align multi-view data and eliminate AFM artifacts simultaneously. Furthermore, we pioneer the application of neural implicit surface reconstruction in nanotechnology and achieve markedly improved results. Extensive experiments show that MVN-AFM effectively eliminates artifacts present in raw AFM images and reconstructs various micro-/nanostructures including complex geometrical microstructures printed via Two-photon Lithography and nanoparticles such as PMMA nanospheres and ZIF-67 nanocrystals. This work presents a cost-effective tool for micro-/nanoscale 3D analysis.
format Preprint
id arxiv_https___arxiv_org_abs_2401_11541
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Multi-View Neural 3D Reconstruction of Micro-/Nanostructures with Atomic Force Microscopy
Chen, Shuo
Peng, Mao
Li, Yijin
Ju, Bing-Feng
Bao, Hujun
Chen, Yuan-Liu
Zhang, Guofeng
Computer Vision and Pattern Recognition
Materials Science
Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete sample topography capturing and tip-sample convolution artifacts. Here, we propose a multi-view neural-network-based framework with AFM (MVN-AFM), which accurately reconstructs surface models of intricate micro-/nanostructures. Unlike previous works, MVN-AFM does not depend on any specially shaped probes or costly modifications to the AFM system. To achieve this, MVN-AFM uniquely employs an iterative method to align multi-view data and eliminate AFM artifacts simultaneously. Furthermore, we pioneer the application of neural implicit surface reconstruction in nanotechnology and achieve markedly improved results. Extensive experiments show that MVN-AFM effectively eliminates artifacts present in raw AFM images and reconstructs various micro-/nanostructures including complex geometrical microstructures printed via Two-photon Lithography and nanoparticles such as PMMA nanospheres and ZIF-67 nanocrystals. This work presents a cost-effective tool for micro-/nanoscale 3D analysis.
title Multi-View Neural 3D Reconstruction of Micro-/Nanostructures with Atomic Force Microscopy
topic Computer Vision and Pattern Recognition
Materials Science
url https://arxiv.org/abs/2401.11541