Spatially Resolved High Voltage Kelvin Probe Force Microcopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

Fuente: arXiv
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Bibliographic Details
Main Authors: McCluskey, Conor J., Sharma, Niyorjyoti, Maguire, Jesi R., Pauly, Serene, Rogers, Andrew, Lindsay, TJ, Holsgrove, Kristina M., Rodriguez, Brian J., Soin, Navneet, Gregg, John Marty, McQuaid, Raymond G. P., Kumar, Amit
Format: Preprint
Published: 2024
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