Resilient Practical Test-Time Adaptation: Soft Batch Normalization Alignment and Entropy-driven Memory Bank

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhou, Xingzhi, Tian, Zhiliang, Cheung, Ka Chun, See, Simon, Zhang, Nevin L.
Format:	Preprint
Published:	2024
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2401.14619