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Main Authors: Mavredakis, Nikolaos, Pacheco-Sanchez, Anibal, Txoperena, Oihana, Torres, Elias, Jiménez, David
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2401.14674
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author Mavredakis, Nikolaos
Pacheco-Sanchez, Anibal
Txoperena, Oihana
Torres, Elias
Jiménez, David
author_facet Mavredakis, Nikolaos
Pacheco-Sanchez, Anibal
Txoperena, Oihana
Torres, Elias
Jiménez, David
contents The main target of this article is to propose for the first time a physics-based continuous and symmetric compact model that accurately captures IV experimental dependencies induced by geometrical scaling effects for graphene transistor (GFET) technologies. Such a scalable model is an indispensable ingredient for the boost of large-scale GFET applications, as it has been already proved in solid industry-based CMOS technologies. Dependencies of the physical model parameters on channel dimensions, are thoroughly investigated, and semi?empirical expressions are derived, which precisely characterize such behaviors for an industry-based GFET technology, as well as for others developed in research labs. This work aims at the establishment of the first industry standard GFET compact model that can be integrated in circuit simulation tools and hence, can contribute to the update of GFET technology from the research level to massive industry production.
format Preprint
id arxiv_https___arxiv_org_abs_2401_14674
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle A Scalable Compact Model for the Static Drain Current of Graphene FETs
Mavredakis, Nikolaos
Pacheco-Sanchez, Anibal
Txoperena, Oihana
Torres, Elias
Jiménez, David
Applied Physics
The main target of this article is to propose for the first time a physics-based continuous and symmetric compact model that accurately captures IV experimental dependencies induced by geometrical scaling effects for graphene transistor (GFET) technologies. Such a scalable model is an indispensable ingredient for the boost of large-scale GFET applications, as it has been already proved in solid industry-based CMOS technologies. Dependencies of the physical model parameters on channel dimensions, are thoroughly investigated, and semi?empirical expressions are derived, which precisely characterize such behaviors for an industry-based GFET technology, as well as for others developed in research labs. This work aims at the establishment of the first industry standard GFET compact model that can be integrated in circuit simulation tools and hence, can contribute to the update of GFET technology from the research level to massive industry production.
title A Scalable Compact Model for the Static Drain Current of Graphene FETs
topic Applied Physics
url https://arxiv.org/abs/2401.14674