Fan, Y., Hu, Q., Wang, Z., Wei, X., & Zhang, Z. (2024). A High-Throughput Dark-Field Full-Field OCT System for Measuring Objects with Different Scattered Light Intensities.
Chicago Style (17th ed.) CitationFan, Youlong, Qingye Hu, Zhongping Wang, Xiantao Wei, and Zengming Zhang. A High-Throughput Dark-Field Full-Field OCT System for Measuring Objects with Different Scattered Light Intensities. 2024.
MLA (9th ed.) CitationFan, Youlong, et al. A High-Throughput Dark-Field Full-Field OCT System for Measuring Objects with Different Scattered Light Intensities. 2024.
Warning: These citations may not always be 100% accurate.