Consistent algorithms for multi-label classification with macro-at-$k$ metrics

Fuente: arXiv

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Bibliographic Details
Main Authors:	Schultheis, Erik, Kotłowski, Wojciech, Wydmuch, Marek, Babbar, Rohit, Borman, Strom, Dembczyński, Krzysztof
Format:	Preprint
Published:	2024
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2401.16594