Time-Dependent Dielectric Breakdown on Subnanometer EOT nMOS FinFETs

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Feijoo, Pedro C., Kauerauf, Thomas, Toledano-Luque, María, Togo, Mitsuhiro, Andrés, Enrique San, Groeseneken, Guido
Format:	Preprint
Published:	2024
Subjects:	Mesoscale and Nanoscale Physics Applied Physics
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2402.00886