Copertina

Time-Dependent Dielectric Breakdown on Subnanometer EOT nMOS FinFETs

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Feijoo, Pedro C., Kauerauf, Thomas, Toledano-Luque, María, Togo, Mitsuhiro, Andrés, Enrique San, Groeseneken, Guido
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Mesoscale and Nanoscale Physics Applied Physics
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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