Pre-Flight Calibration of PIXL for X-ray Fluorescence Elemental Quantification

Fuente: arXiv
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Auteurs principaux: Heirwegh, Christopher M., Elam, William Timothy, Liu, Yang, Das, Anusheela, Hummel, Christopher, Naylor, Bret, Wade, Lawrence A., Allwood, Abigail C., Hurowitz, Joel A., Armstrong, Les G., Bacop, Naomi, O'Neil, Lauren P., Sinclair, Kimberly P., Sondheim, Michael E., Denise, Robert W., Lawson, Peter R., Rosas, Rogelio, Kawamura, Jonathan H., Au, Mitchell H., Kitiyakara, Amarit, Foote, Marc C., Romero, Raul A., Anderson, Mark S., Rossman, George R., Clark III, Benton C.
Format: Preprint
Publié: 2024
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_version_ 1866917581266354176
author Heirwegh, Christopher M.
Elam, William Timothy
Liu, Yang
Das, Anusheela
Hummel, Christopher
Naylor, Bret
Wade, Lawrence A.
Allwood, Abigail C.
Hurowitz, Joel A.
Armstrong, Les G.
Bacop, Naomi
O'Neil, Lauren P.
Sinclair, Kimberly P.
Sondheim, Michael E.
Denise, Robert W.
Lawson, Peter R.
Rosas, Rogelio
Kawamura, Jonathan H.
Au, Mitchell H.
Kitiyakara, Amarit
Foote, Marc C.
Romero, Raul A.
Anderson, Mark S.
Rossman, George R.
Clark III, Benton C.
author_facet Heirwegh, Christopher M.
Elam, William Timothy
Liu, Yang
Das, Anusheela
Hummel, Christopher
Naylor, Bret
Wade, Lawrence A.
Allwood, Abigail C.
Hurowitz, Joel A.
Armstrong, Les G.
Bacop, Naomi
O'Neil, Lauren P.
Sinclair, Kimberly P.
Sondheim, Michael E.
Denise, Robert W.
Lawson, Peter R.
Rosas, Rogelio
Kawamura, Jonathan H.
Au, Mitchell H.
Kitiyakara, Amarit
Foote, Marc C.
Romero, Raul A.
Anderson, Mark S.
Rossman, George R.
Clark III, Benton C.
contents The Planetary Instrument for X-ray Lithochemistry (PIXL) is a rasterable focused-beam X-ray fluorescence (XRF) spectrometer mounted on the arm of National Aeronautics and Space Administration's (NASA) Mars 2020 Perseverance rover. To ensure that PIXL would be capable of performing accurate in-flight compositional analysis of martian targets, in situ, an elemental calibration was performed pre-flight on the PIXL flight instrument in a simulated martian environment. The details of this calibration, and implications for measuring unknown materials on Mars are the subjects of this paper. The major goals of this calibration were both to align the spectrometer to perform accurate elemental analysis and, to derive a matrix of uncertainties that are applied to XRF measurements of all elements in unknown materials. A small set of pure element and pure compound targets and geologically relevant reference materials were measured with the flight hardware in a simulated martian environment. Elemental calibration and quantifications were carried out using PIXL's XRF quantification software (PIQUANT). Uncertainties generated were implemented into the PIQUANT software version employed by the PIXL's data visualization software (PIXLISE). We outline in this work, a list of factors that impact micro-XRF accuracy, the methodology and steps involved in the calibration, details on the fabrication of the uncertainty matrix, instructions on the use and interpretations of the uncertainties applied to unknowns and an assessment on the limitations and areas open to future improvement as part of subsequent calibration efforts.
format Preprint
id arxiv_https___arxiv_org_abs_2402_01544
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Pre-Flight Calibration of PIXL for X-ray Fluorescence Elemental Quantification
Heirwegh, Christopher M.
Elam, William Timothy
Liu, Yang
Das, Anusheela
Hummel, Christopher
Naylor, Bret
Wade, Lawrence A.
Allwood, Abigail C.
Hurowitz, Joel A.
Armstrong, Les G.
Bacop, Naomi
O'Neil, Lauren P.
Sinclair, Kimberly P.
Sondheim, Michael E.
Denise, Robert W.
Lawson, Peter R.
Rosas, Rogelio
Kawamura, Jonathan H.
Au, Mitchell H.
Kitiyakara, Amarit
Foote, Marc C.
Romero, Raul A.
Anderson, Mark S.
Rossman, George R.
Clark III, Benton C.
Applied Physics
Instrumentation and Methods for Astrophysics
Instrumentation and Detectors
Space Physics
The Planetary Instrument for X-ray Lithochemistry (PIXL) is a rasterable focused-beam X-ray fluorescence (XRF) spectrometer mounted on the arm of National Aeronautics and Space Administration's (NASA) Mars 2020 Perseverance rover. To ensure that PIXL would be capable of performing accurate in-flight compositional analysis of martian targets, in situ, an elemental calibration was performed pre-flight on the PIXL flight instrument in a simulated martian environment. The details of this calibration, and implications for measuring unknown materials on Mars are the subjects of this paper. The major goals of this calibration were both to align the spectrometer to perform accurate elemental analysis and, to derive a matrix of uncertainties that are applied to XRF measurements of all elements in unknown materials. A small set of pure element and pure compound targets and geologically relevant reference materials were measured with the flight hardware in a simulated martian environment. Elemental calibration and quantifications were carried out using PIXL's XRF quantification software (PIQUANT). Uncertainties generated were implemented into the PIQUANT software version employed by the PIXL's data visualization software (PIXLISE). We outline in this work, a list of factors that impact micro-XRF accuracy, the methodology and steps involved in the calibration, details on the fabrication of the uncertainty matrix, instructions on the use and interpretations of the uncertainties applied to unknowns and an assessment on the limitations and areas open to future improvement as part of subsequent calibration efforts.
title Pre-Flight Calibration of PIXL for X-ray Fluorescence Elemental Quantification
topic Applied Physics
Instrumentation and Methods for Astrophysics
Instrumentation and Detectors
Space Physics
url https://arxiv.org/abs/2402.01544