Thermal expansion and temperature dependence of Raman modes in epitaxial layers of Ge and Ge$_{1-x}$Sn$_{x}$

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Corley-Wiciak, Agnieszka Anna, Ryzhak, Diana, Zoellner, Marvin Hartwig, Manganelli, Costanza Lucia, Concepción, Omar, Skibitzki, Oliver, Grützmacher, Detlev, Buca, Dan, Capellini, Giovanni, Spirito, Davide
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866914666876239872
author Corley-Wiciak, Agnieszka Anna
Ryzhak, Diana
Zoellner, Marvin Hartwig
Manganelli, Costanza Lucia
Concepción, Omar
Skibitzki, Oliver
Grützmacher, Detlev
Buca, Dan
Capellini, Giovanni
Spirito, Davide
author_facet Corley-Wiciak, Agnieszka Anna
Ryzhak, Diana
Zoellner, Marvin Hartwig
Manganelli, Costanza Lucia
Concepción, Omar
Skibitzki, Oliver
Grützmacher, Detlev
Buca, Dan
Capellini, Giovanni
Spirito, Davide
contents Temperature dependence of vibrational modes in semiconductors depends on lattice thermal expansion and anharmonic phonon-phonon scattering. Evaluating the two contributions from experimental data is not straightforward, especially for epitaxial layers that present mechanical deformation and anisotropic lattice expansion. In this work, a temperature-dependent Raman study in epitaxial Ge and Ge$_{1-x}$Sn$_{x}$ layers is presented. A model is introduced for the Raman mode energy shift as a function of temperature, comprising thermal expansion of the strained lattice and anharmonic corrections. With support of x-ray diffraction, the model is calibrated on experimental data of epitaxial Ge grown on Si and Ge$_{1-x}$Sn$_{x}$ grown on Ge/Si, finding that the main difference between bulk and epitaxial layers is related to the anisotropic lattice expansion. The phonon anharmonicity and other parameters do not depend on dislocation defect density (in the range $7\cdot 10^6$ - $4\cdot 10^8$ cm$^{-2}$) nor on alloy composition in the range 5-14 at.%. The strain-shift coefficient for the main model of Ge and for the Ge-Ge vibrational mode of Ge$_{1-x}$Sn$_{x}$ is weakly dependent on temperature and is around -500 cm$^{-1}$. In Ge$_{1-x}$Sn$_{x}$, the composition-shift coefficient amounts to -100 cm$^{-1}$, independent of temperature and strain.
format Preprint
id arxiv_https___arxiv_org_abs_2402_02967
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Thermal expansion and temperature dependence of Raman modes in epitaxial layers of Ge and Ge$_{1-x}$Sn$_{x}$
Corley-Wiciak, Agnieszka Anna
Ryzhak, Diana
Zoellner, Marvin Hartwig
Manganelli, Costanza Lucia
Concepción, Omar
Skibitzki, Oliver
Grützmacher, Detlev
Buca, Dan
Capellini, Giovanni
Spirito, Davide
Materials Science
Mesoscale and Nanoscale Physics
Temperature dependence of vibrational modes in semiconductors depends on lattice thermal expansion and anharmonic phonon-phonon scattering. Evaluating the two contributions from experimental data is not straightforward, especially for epitaxial layers that present mechanical deformation and anisotropic lattice expansion. In this work, a temperature-dependent Raman study in epitaxial Ge and Ge$_{1-x}$Sn$_{x}$ layers is presented. A model is introduced for the Raman mode energy shift as a function of temperature, comprising thermal expansion of the strained lattice and anharmonic corrections. With support of x-ray diffraction, the model is calibrated on experimental data of epitaxial Ge grown on Si and Ge$_{1-x}$Sn$_{x}$ grown on Ge/Si, finding that the main difference between bulk and epitaxial layers is related to the anisotropic lattice expansion. The phonon anharmonicity and other parameters do not depend on dislocation defect density (in the range $7\cdot 10^6$ - $4\cdot 10^8$ cm$^{-2}$) nor on alloy composition in the range 5-14 at.%. The strain-shift coefficient for the main model of Ge and for the Ge-Ge vibrational mode of Ge$_{1-x}$Sn$_{x}$ is weakly dependent on temperature and is around -500 cm$^{-1}$. In Ge$_{1-x}$Sn$_{x}$, the composition-shift coefficient amounts to -100 cm$^{-1}$, independent of temperature and strain.
title Thermal expansion and temperature dependence of Raman modes in epitaxial layers of Ge and Ge$_{1-x}$Sn$_{x}$
topic Materials Science
Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2402.02967